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PDF SI514 Data sheet ( Hoja de datos )
| Número de pieza | SI514 | |
| Descripción | ANY-FREQUENCY I2C PROGRAMMABLE XO | |
| Fabricantes | Silicon Laboratories | |
| Logotipo |  |
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Si514
ANY-FREQUENCY I2C PROGRAMMABLE XO (100 kHZ TO 250 MHZ)
Features
Programmable to any frequency On-chip LDO for power supply
from 100 kHz to 250 MHz
noise filtering
0.026 ppb frequency tuning
3.3, 2.5, or 1.8 V operation
resolution
Differential (LVPECL, LVDS,
Glitch suppression on OE, power HCSL) or CMOS output options
on and frequency transitions
Optional integrated 1:2 CMOS
Low jitter operation
fanout buffer
2- to 4-week lead times
Industry standard 5 x 7 and
Total stability includes 10-year
3.2 x 5 mm packages
aging
–40 to 85 oC operation
Comprehensive production test
coverage includes crystal ESR and
DLD
Applications
All-digital PLLs
DAC+ VCXO replacement
SONET/SDH/OTN
3G-SDI/HD-SDI/SDI
Datacom
Industrial automation
FPGA/ASIC clock generation
FPGA synchronization
Description
The Si514 user-programmable I2C XO utilizes Silicon Laboratories' advanced PLL
technology to provide any frequency from 100 kHz to 250 MHz with programming
resolution of 0.026 parts per billion. The Si514 uses a single integrated crystal and
Silicon Labs’ proprietary DSPLL synthesizer to generate any frequency across this
range using simple I2C commands. Ultra-fine tuning resolution replaces DACs and
VCXOs with an all-digital PLL solution that improves performance where
synchronization is necessary or in free-running reference clock applications. This
solution provides superior supply noise rejection, simplifying low jitter clock
generation in noisy environments. Crystal ESR and DLD are individually
production-tested to guarantee performance and enhance reliability.
The Si514 is factory-configurable for a wide variety of user specifications, including
startup frequency, I2C address, supply voltage, output format, and stability. Specific
configurations are factory-programmed at time of shipment, eliminating long lead
times and non-recurring engineering charges associated with custom frequency
oscillators.
Functional Block Diagram
Si5602
Ordering Information:
See page 28.
Pin Assignments:
See page 27.
SDA 1
SCL 2
GND 3
6 VDD
5 CLK–
4 CLK+
Rev. 1.0 5/12
Copyright © 2012 by Silicon Laboratories
Si514
1 page  
Si514
Table 3. Output Clock Frequency Characteristics
VDD = 1.8 V ±5%, 2.5 or 3.3 V ±10%, TA = –40 to +85 oC
Parameter
Programmable
Frequency Range
Frequency
Reprogramming
Resolution
Frequency Range for
Small Frequency Change
(Continuous Glitchless
Output)
Settling time for Small
Frequency Change
Settling time for Large
Frequency Change (Out-
put Squelched during Fre-
quency Transition)
Total Stability*
Symbol
FO
FO
MRES
Test Condition
CMOS, Dual CMOS
LVDS/LVPECL/HCSL
From center frequency
<±1000 ppm from
center frequency
>±1000 ppm from
center frequency
Frequency Stability Grade C
Frequency Stability Grade B
Frequency Stability Grade A
Min Typ Max Units
0.1 — 212.5 MHz
0.1 — 250 MHz
— 0.026 —
ppb
–1000 — +1000 ppm
— — 100 µs
— — 10 ms
–30 — +30 ppm
–50 — +50 ppm
–100 — +100 ppm
Temperature Stability
Startup Time
Disable Time
Enable Time
Frequency Stability Grade C –20 — +20 ppm
Frequency Stability Grade B –25 — +25 ppm
Frequency Stability Grade A –50 — +50 ppm
TSU Minimum VDD until output
— — 10 ms
frequency (FO) within specification
TD FO < 10 MHz
— — 40 µs
FO 10 MHz
——
5 µs
TE FO < 10 MHz
— — 60 µs
FO 10 MHz
— — 20 µs
*Note: Total stability includes initial accuracy, operating temperature, supply voltage change, load change, shock and
vibration (not under operation), and 10 years aging at 40 oC.
Rev. 1.0
5
5 Page 
Table 10. Thermal Characteristics
Parameter
Thermal Resistance Junction to Ambient*
*Note: Applies to 5 x 7 and 3.2 x 5 mm packages.
Si514
Symbol
JA
Test Condition
Still air
Value
110
Units
°C/W
Table 11. Absolute Maximum Ratings1
Parameter
Maximum Operating Temperature
Storage Temperature
Supply Voltage
Input Voltage (any input pin)
ESD Sensitivity (HBM, per JESD22-A114)
Symbol
TAMAX
TS
VDD
VI
HBM
Rating
85
–55 to +125
–0.5 to +3.8
–0.5 to VDD + 0.3
2
Units
oC
oC
V
V
kV
Soldering Temperature (Pb-free profile)2
Soldering Temperature Time at TPEAK (Pb-free profile)2
TPEAK
TP
260
20–40
oC
sec
Notes:
1. Stresses beyond those listed in this table may cause permanent damage to the device. Functional operation or
specification compliance is not implied at these conditions. Exposure to maximum rating conditions for extended
periods may affect device reliability.
2. The device is compliant with JEDEC J-STD-020.
Rev. 1.0
11
11 Page | ||
| Páginas | Total 30 Páginas | |
| PDF Descargar | [ Datasheet SI514.PDF ] | |
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