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PDF AM27S33 Data sheet ( Hoja de datos )
| Número de pieza | AM27S33 | |
| Descripción | 4096 bit Bipolar PROM | |
| Fabricantes | Advanced Micro Devices | |
| Logotipo |  |
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<2o5 -
Am27S33/27S33A
4,096-Bit (1024x4) Bipolar PROM
a
Advanced
Micro
Devices
DISTINCTIVE CHARACTERISTICS
• High speed
• Highly reliable, ultra-fast programming Platnum-Silicide
fuses
• High programming yield
• Low-current PNP inputs
• High-current open-collector and three-state outputs
• Fast chip select
GENERAL DESCRIPTION
The Am27S33 (1024 words by 4 bits) is a Schottky TTL
Programmable Read-Only Memory (PROM).
This device is available in three-state (Am27S33) output
versions. These outputs are compatible with low-power
Schotkky bus standards capable of satisfying the require-
ments of a vanety of microprogrammable controls, mapping
functions, code conversion, or logic replacement Easy
word-depth expansion is facilitated by active LOW (57 &
S i ) output enables.
BLOCK DIAGRAM
Oe 03
B0006190
PRODUCT SELECTOR GUIDE
Three-State
Part Number
Address
Access Tim*
Operating
Range
Am27S33A
35 ns
45 ns
CM
Am27S33
55 ns
70 ns
CM
PuDtatmn t fl»L Anrnnrtrrmm
0322S
0
10
Issue OaM' January 1989
5-111
1 page  
ABSOLUTE MAXIMUM RATINGS
Storage Temperature
- 6 5 to + 150°C
Ambient Temperature with
Power Applied
- 5 5 to + 125°C
Supply Voltage
- 0 5 V to + 7 0 V
OC Voltage Applied to Outputs
(Except Dunng Programming)
- 0 . 5 V to +V<xMax.
OC Voltage Applied to Outputs
Ounng Programming
21 V
Output Current into Outputs Dunng
Programming (Max Duration of 1 sec)
250 mA
DC Input Voltage
- 0 5 V to + 5 5 V
DC Input Current
- 3 0 mA to + 5 mA
Stresses above those listed under ABSOLUTE MAXIMUM
RA TINGS may cause permanent device failure. Functionality
at or above these limits is not implied. Exposure to absolute
maximum ratings for extended periods may affect device
reliability.
OPERATING RANGES
Commercial (C) Devices
Ambient Temperature (TA)
Supply Voltage (Vcc)
0 to + 75°C
+475 V to + 5 25 V
Military (M) Devices*
Case Temperature 0 c )
Supply Voltage (VCc)
- 5 5 to + 125°C
+4.5 V to + 5 5 V
Operating ranges define those limits between which the
functionality of the device is guaranteed.
'Military Product 100% tested at T<; - + 25°C, + 125°C,
and -55°C.
DC CHARACTERISTICS over operating ranges unless otherwise specified (for APL Products, Group A,
Subgroups 1, 2, 3 are tested unless otherwise noted)
Parameter
Symbol
Parameter
Description
Test Conditions
Min. Typ.
Max.
Unit
VOH
Output HIGH Voltage
Vcc - Mm . Ioh - -2.0 mA
V|N - Vih or V|t
2.4 V
VOL Output LOW Voltage
Vih Input HIGH Level
VCC ~ Min., I q l - 16 mA
V|N - Vih or V|L
Guaranteed input logical HIGH
voltage for all inputs (Note 1)
0.4S V
2.0 V
VlL Input LOW Level
Guaranteed input logical LOW
voltage for all inputs (Note 1)
0.8 V
IlL
l|H
'sc
(Note 1)
Input LOW Current
Input HIGH Current
Output Short-Circuit Current
Vcc " Max, V|N - 0.45 V
Vcc " Max.. Vin - 2.7 V
VCC " Max.. V q u t - 0 0 V (Note 2)
- 0 250
25
mA
HA
-20 -90 mA
Icc
V|
'CEX
Qn
Cout
Power Supply Current
Input Clamp Voltage
Output Leakage Current
Input Capacitance
Output Capacitance
All inputs - GNO,
Vcc-Max.
Vcc - Mm., I|N — — 18 mA
Vcc " Max.
V57-2.4 V
(Note 1)
Vin - 2.0 V @ f - 1 MHz (Note 3)
Vcc - 5 V, TA - 25'C
VouT - 2.0 V @ 1 - 1 MHz (Note 3)
Vcc - 5 V. TA - 25'C
COM'L
MIL
V0-Vcc
Vo - 2.4 V
VQ - 0.4 V
140 mA
145
-12 V
40
40 M
-40
s
pF
3
Nona: 1. Vh. and Vih are input conditions of output tests and are not themselves directly tested. V i l and Vih are absolute voltages with respect to device
ground and include all overshoots due to system and/or tester noise Oo not attempt to test these values without suitable equipment
2. Not more than one output should be shorted at a time. Duration of the short circuit snouid not be more than one second.
3. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where capacitance
may be affected.
SWITCHING CHARACTERISTICS over operating ranges unless otherwise specified (for APL Products.
Group A, Subgroups 9, 10, 11 are tested unless otherwise noted*)
Parameter
No. Symbol
Parameter
Description
1 TAVQV
Address VaM to Output Valid
Access Time
2 TGVQZ
Delay from Output Enable Valid to
Output Hi-Z
3 TGVQV
Delay from Output Enable Valid to
Output VaM
Am27S33A
COM'L
MIL
Min. Max. Min. Max.
35 45
20 25
20 25
Am27S33
COM'L
MIL
Min.
Max.
55
Min.
Max.
70
25 30
25 30
Unit
ns
ns
ns
See also Switching Test Circuit
Notes: 1. Tests are performed with input transition time of 5 ns or less, timing reference levels of 1.S V. and input pulse levels of 0 to 3 0 V.
'Subgroups 7 and 8 apply to functional tests.
Am27S33/27S33A
5-115
5 Page | ||
| Páginas | Total 6 Páginas | |
| PDF Descargar | [ Datasheet AM27S33.PDF ] | |
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