DataSheet.es    


PDF 7704402xx Data sheet ( Hoja de datos )

Número de pieza 7704402xx
Descripción (77044xxxx) LOGIC GATE
Fabricantes Intersil　
Logotipo Intersil Logotipo



Hay una vista previa y un enlace de descarga de 7704402xx (archivo pdf) en la parte inferior de esta página.


Total 13 Páginas

No Preview Available ! 7704402xx Hoja de datos, Descripción, Manual

REVISIONS
omLTR
DESCRIPTION
DATE (YR-MO-DA)
APPROVED
U.cC Convert to standardized military drawing format. Added device type 02.
t4Technical changes in 1.3, 1.4, table I and Table II. Delete CAGE 31019. Add
CAGE 18714. No approved sources for device type 01. Add figure 3. Editorial
echanges throughout.
heD Add device 03. Update boilerplate.
taSE Update boilerplate to MIL-PRF-38535 requirements. - jak
89-07-26
94-03-08
01-03-20
M. A. Frye
Monica L. Poelking
Thomas M. Hess
aF Made change to paragraph 3.5. Update boilerplate to MIL-PRF-38535
.Drequirements. - LTG
05-03-14
Thomas M. Hess
www U.comDevice type 01AX is
inactive for new design
t4as of 1 Oct. 1986
eFIRST PAGE OF THIS DRAWING HAS BEEN CHANGED.
heCURRENT CAGE CODE 67268
SREV
taSHEET
REV
aSHEET
.DREV STATUS
OF SHEETS
wPMIC N/A
wSTANDARD
w omMICROCIRCUIT
.cDRAWING
REV
SHEET
F F F F F F FF F F F F
1 2 3 4 5 6 7 8 9 10 11 12
PREPARED BY
A. J. Foley
CHECKED BY
C. R. Jackson
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
http://www.dscc.dla.mil
t4UTHIS DRAWING IS AVAILABLE
FOR USE BY ALL
eDEPARTMENTS
eAND AGENCIES OF THE
hDEPARTMENT OF DEFENSE
ataSAMSC N/A
APPROVED BY
Nelson A. Hauck
DRAWING APPROVAL DATE
77-09-26
REVISION LEVEL
F
w.DDSCC FORM 2233
wwAPR 97
MICROCIRCUIT, DIGITAL, CMOS, NOR
GATES, MONOLITHIC SILICON
SIZE
A
SHEET
CAGE CODE
14933
1 OF 12
77044
5962-E202-05

1 page




7704402xx pdf
TABLE I. Electrical performance characteristics.
Test Symbol
Test conditions
-55°C ≤ TC ≤ +125°C
unless otherwise specified
Quiescent current
IDD
1/
Low level output
voltage
VOL
High-level output
voltage
VOH
Low level input
voltage
VIL
High-level input
voltage
VIH
VDD = 5.0 V
VIN = 0.0 V or VDD
VDD = 10.0 V
VIN = 0.0 V or VDD
VDD = 15.0 V
VIN = 0.0 V or VDD
VDD = 20.0 V 2/
VIN = 0.0 V or VDD
VDD = 5.0 V 1/
VIN = 0.0 V or VDD, | IO | < 1.0 µA
VDD = 10.0 V 1/
VIN = 0.0 V or VDD, | IO | < 1.0 µA
VDD = 15.0 V
VIN = 0.0 V or VDD, | IO | < 1.0 µA
VDD = 5.0 V 1/
VIN = VDD or 0.0 V, | IO | < 1.0 µA
VDD = 10.0 V 1/
VIN = VDD or 0.0 V, | IO | < 1.0 µA
VDD = 15.0 V
VIN = VDD or 0.0 V, | IO | < 1.0 µA
VDD = 5.0 V
VOUT = 0.5 V or 4.5 V
VDD = 10.0 V 1/
VOUT = 1.0 V or 9.0 V
VDD = 15.0 V
VOUT = 1.5 V or 13.5 V
VDD = 5.0 V
VOUT = 0.5 V or 4.5 V
VDD = 10.0 V 1/
VOUT = 1.0 V or 9.0 V
VDD = 15.0 V
VOUT = 1.5 V or 13.5 V
Device Group A
type subgroups
Limits
Unit
01
02, 03
01
02, 03
01
02, 03
02, 03
All
All
All
All
All
All
All
All
All
All
All
All
1, 2, 3
1, 3
2
1, 2, 3
1, 3
2
1, 2, 3
1, 3
2
1, 3
2
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
Min Max
10.0 µA
0.25
7.5
20.0
0.5
15.0
40.0
1.0
30.0
5.0
150.0
0.05 V
0.05
0.05
4.95
9.95
14.95
1.5
3.0
4.0
V
V
3.5 V
7.0
11.0
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
F
77044
SHEET
5

5 Page





7704402xx arduino
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,
appendix A.
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
prior to quality conformance inspection. The following additional criteria shall apply:
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method
1015 of MIL-STD-883.
(2) TA = +125°C, minimum.
b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of
MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3.1 Group A inspection.
a. Tests shall be as specified in table II herein.
b. Subgroup 4 (CIN measurement) shall be measured only for the initial test and after process or design changes which
may affect input capacitance. Capacitance shall be measured between the designated terminal and VSS at a frequency
of 1 MHz. Test all applicable pins on 5 devices with zero failures.
c. Subgroups 7 and 8 shall include verification of the truth table as specified on figure 2.
4.3.2 Groups C and D inspections.
a. End-point electrical parameters shall be as specified in table II herein.
b. Steady-state life test conditions, method 1005 of MIL-STD-883.
(1) Test condition A, B, C, and D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1005 of MIL-STD-883.
(2) TA = +125°C, minimum.
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
F
77044
SHEET
11

11 Page







PáginasTotal 13 Páginas
PDF Descargar[ Datasheet 7704402xx.PDF ]




Hoja de datos destacado

Número de piezaDescripciónFabricantes
7704402xx(77044xxxx) LOGIC GATEIntersil
Intersil

Número de piezaDescripciónFabricantes
SLA6805M

High Voltage 3 phase Motor Driver IC.

 Sanken
Sanken
SDC1742

12- and 14-Bit Hybrid Synchro / Resolver-to-Digital Converters.

 Analog Devices
Analog Devices


DataSheet.es es una pagina web que funciona como un repositorio de manuales o hoja de datos de muchos de los productos más populares,
permitiéndote verlos en linea o descargarlos en PDF.


DataSheet.es    |   2020   |  Privacy Policy  |  Contacto  |  Buscar