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PDF NDS351N Data sheet ( Hoja de datos )

Número de pieza NDS351N
Descripción N-Channel Logic Level Enhancement Mode Field Effect Transistor
Fabricantes Fairchild 
Logotipo Fairchild Logotipo



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March 1996
NDS351N
N-Channel Logic Level Enhancement Mode Field Effect Transistor
General Description
These N-Channel logic level enhancement mode power
field effect transistors are produced using Fairchild's
proprietary, high cell density, DMOS technology. This
very high density process is especially tailored to
minimize on-state resistance. These devices are
particularly suited for low voltage applications in notebook
computers, portable phones, PCMCIA cards, and other
battery powered circuits where fast switching, and low
in-line power loss are needed in a very small outline
surface mount package.
Features
1.1A, 30V. RDS(ON) = 0.25@ VGS = 4.5V.
Proprietary package design using copper lead frame for
superior thermal and electrical capabilities.
High density cell design for extremely low RDS(ON).
Exceptional on-resistance and maximum DC current
capability.
Compact industry standard SOT-23 surface mount
package.
________________________________________________________________________________
D
GS
Absolute Maximum Ratings
Symbol Parameter
TA = 25°C unless otherwise noted
VDSS
Drain-Source Voltage
VGSS
Gate-Source Voltage - Continuous
ID Maximum Drain Current - Continuous
- Pulsed
PD Maximum Power Dissipation
(Note 1a)
(Note 1a)
(Note 1b)
TJ,TSTG Operating and Storage Temperature Range
THERMAL CHARACTERISTICS
RθJA
RθJC
Thermal Resistance, Junction-to-Ambient
Thermal Resistance, Junction-to-Case
(Note 1a)
(Note 1)
NDS351N
30
20
± 1.1
± 10
0.5
0.46
-55 to 150
250
75
© 1997 Fairchild Semiconductor Corporation
Units
V
V
A
W
°C
°C/W
°C/W
NDS351N Rev. E2

1 page




NDS351N pdf
Typical Electrical Characteristics (continued)
1.15
I D = 250µA
1.1
1.05
1
0.95
0.9
-50
-25
0 25 50 75 100 125 150
TJ , JUNCTION TEMPERATURE (°C)
Figure 7. Breakdown Voltage Variation with
Temperature
5
2 V GS = 0V
1
0.5
0.2 T J= 125°C
0.1
25°C
0.01
-55°C
0.001
0.3
0.6 0.9
VSD , BODY DIODE FORWARD VOLTAGE (V)
1.2
Figure 8. Body Diode Forward Voltage Variation
with Current and Temperature
300
200
C iss
100 C oss
50
30
20
10
0.1
f = 1 MHz
VGS = 0V
C rss
0.2
0.5 1
2
5 10
VDS , DRAIN TO SOURCE VOLTAGE (V)
20 30
Figure 9. Capacitance Characteristics
10
IDS = 1.1A
8
VDS= 5V
6
4
2
0
0123
Qg , GATE CHARGE (nC)
Figure 10. Gate Charge Characteristics
10V
4
VIN
VGS
RGEN
G
VDD
RL
D
V OUT
DUT
S
t d(on)
t on
tr
90%
t d(off)
toff
tf
90%
Output, Vout
Input, Vin
10%
10%
50%
10%
90% Inverted
50%
Pulse Width
Figure 11. Switching Test Circuit
Figure 12. Switching Waveforms
NDS351N Rev. E2

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