N74F640 Datasheet PDF - Philips
Part Number | N74F640 | |
Description | Octal bus transceiver / inverting 3-State | |
Manufacturers | Philips | |
Logo | ||
There is a preview and N74F640 download ( pdf file ) link at the bottom of this page. Total 11 Pages |
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74F640
Octal bus transceiver, inverting (3-State)
Product specification
IC15 Data Handbook
1989 Nov 27
Philips
Semiconductors
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Philips Semiconductors
Octal bus transceiver, inverting (3-State)
Product specification
74F640
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONSNO TAG
LIMITS
MIN
TYP
NO TAG
MAX
UNIT
VOH
High-level output voltage
A0–A7
B0–B7
B0–B7
VCC = MIN,
VIL = MAX,
VIH = MIN
IOH = –3mA
IOH = –15mA
±10%VCC
±5%VCC
±10%VCC
±5%VCC
2.4
2.7
2.0
2.0
3.3
V
V
V
V
±10%VCC
A0–A7
VCC = MIN,
IOL = 24mA
±5%VCC
VOL
Low-level output voltage
B0–B7
VIL = MAX,
VIH = MIN,
IOL = MAX
±10%VCC
±5%VCC
0.35 0.50
0.35 0.50
0.55
0.42 0.55
V
V
V
V
VIK Input clamp voltage
VCC = MIN, II = IIK
–0.73 –1.2
V
II
Input current at maximum
input voltage
OE,
T/R
VCC = 0.0V, VI = 7.0V
A0–A7,
B0–B7
VCC = 5.5V, VI = 5.5V
100 µA
1.0 mA
IIH
High-level input current
OE, VCC = MAX, VI = 2.7V
T/R
IIL Low-level input current only VCC = MAX, VI = 0.5V
40 µA
–40 µA
IOZH+IIH
Off-state output current,
High level of voltage applied
VCC = MAX, VI = 2.7V
70 µA
IOZL+IIL
Off-state output current,
Low level of voltage applied
VCC = MAX, VI = 0.5V
–70 µA
IOS
Short-circuit output cur-
rentNO TAG
A0–A7
VCC = MAX
B0–B7
–60
–100
–150
–225
mA
µA
ICCH
T/R = An = 4.5V,
OE = GND
66 85 mA
ICC Supply current (total)
ICCL VCC = MAX T/R = Bn = OE = GND
91 120 mA
ICCZ
T/R = Bn = GND,
OE = 4.5V
78 102 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
1989 Nov 27
5
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