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PDF CPC1706 Data sheet ( Hoja de datos )

Número de pieza CPC1706
Descripción DC Power SIP Relay
Fabricantes IXYS 
Logotipo IXYS Logotipo



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No Preview Available ! CPC1706 Hoja de datos, Descripción, Manual

INTEGRATED CIRCUITS DIVISION
Parameter
Blocking Voltage
Load Current
On-Resistance (max)
Rating
60
4
0.09
Units
VP
ADC
Features
Handle Load Currents Up to 4ADC
2500Vrms Input/Output Isolation
Power SIP Package
High Reliability
Low Drive Power Requirements
Arc-Free With No Snubbing Circuits
No EMI/RFI Generation
Flammability Rating UL 94 V-0
Applications
Industrial Controls
Motor Control
Robotics
Medical Equipment—Patient/Equipment Isolation
Instrumentation
Multiplexers
Data Acquisition
Electronic Switching
I/O Subsystems
Meters (Watt-Hour, Water, Gas)
IC Equipment
Home Appliances
CPC1706
Single-Pole, Normally Open
4-Pin OptoMOS® DC Power SIP Relay
Description
IXYS Integrated Circuits Division and IXYS have
combined to bring OptoMOS® technology, reliability,
and compact size to a new family of high power solid
state relays. The CPC1706, a DC-switching, normally
open (1-Form-A) Solid State Relay, is part of that
family.
Employing optically coupled MOSFET technology,
the CPC1706 provides 2500Vrms of input to output
isolation. The relay output is constructed with efficient
MOSFET switches that use IXYS Integrated Circuits
Division's patented OptoMOS architecture. The input,
a highly efficient infrared LED, controls the optically
coupled output.
The combination of low on-resistance and high load
current handling capability makes this relay suitable for
a variety of high performance switching applications.
Approvals
UL 508 Certified Component: File E69938
CSA Certified Component: Certificate 1172007
Ordering Information
Part #
Description
CPC1706Y 4-Pin (8-Pin Body) Power SIP Package (25 per tube)
Pin Configuration
DS-CPC1706-R04
Switching Characteristics of
Normally Open Devices
Form-A
IF
ILOAD
90%
ton
10%
toff
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CPC1706 pdf
INTEGRATED CIRCUITS DIVISION
CPC1706
Manufacturing Information
Moisture Sensitivity
All plastic encapsulated semiconductor packages are susceptible to moisture ingression. IXYS Integrated
Circuits Division classifies its plastic encapsulated devices for moisture sensitivity according to the latest
version of the joint industry standard, IPC/JEDEC J-STD-020, in force at the time of product evaluation. We
test all of our products to the maximum conditions set forth in the standard, and guarantee proper operation of our
devices when handled according to the limitations and information in that standard as well as to any limitations set
forth in the information or standards referenced below.
Failure to adhere to the warnings or limitations as established by the listed specifications could result in reduced
product performance, reduction of operable life, and/or reduction of overall reliability.
This product carries a Moisture Sensitivity Level (MSL) classification as shown below, and should be handled
according to the requirements of the latest version of the joint industry standard IPC/JEDEC J-STD-033.
Device
CPC1706Y
Moisture Sensitivity Level (MSL) Classification
MSL 1
ESD Sensitivity
This product is ESD Sensitive, and should be handled according to the industry standard JESD-625.
Soldering Profile
Provided in the table below is the Classification Temperature (TC) of this product and the maximum dwell time the
body temperature of this device may be above (TC - 5)ºC. The classification temperature sets the Maximum Body
Temperature allowed for this device during lead-free reflow processes. For through hole devices, and any other
processes, the guidelines of J-STD-020 must be observed.
Device
CPC1706Y
Classification Temperature (Tc)
245ºC
Dwell Time (tp)
30 seconds
Max Reflow Cycles
1
Board Wash
IXYS Integrated Circuits Division recommends the use of no-clean flux formulations. Board washing to reduce
or remove flux residue following the solder reflow process is acceptable provided proper precautions are taken
to prevent damage to the device. These precautions include, but are not limited to: using a low pressure wash
and providing a follow up bake cycle sufficient to remove any moisture trapped within the device due to the
washing process. Due to the variability of the wash parameters used to clean the board, determination of the bake
temperature and duration necessary to remove the moisture trapped within the package is the responsibility of the
user (assembler). Cleaning or drying methods that employ ultrasonic energy may damage the device and should
not be used. Additionally, the device must not be exposed to flux or solvents that are Chlorine- or Fluorine-based.
Cleaning methods that employ ultrasonic energy should not be used.
R04 www.ixysic.com
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